This work is an introduction of acoustic emission (AE) signals used in order to detect the malfunction of selected semiconductor elements. The authors proposed the use of internally generated signals (elastic waves) of acoustic emission leading to the detection of the pre-fail state of switching IGBT transistors. The analysis of the AE signals allows the creation of a reference patter... https://www.duospiritalis.com/top-deal-Serra-Avatar-Urza-s-Saga-clearance/